Publications

X Author: C. Hu

2020

2019

Stern, Rebecca D., Danielle C. Hutchison, Morgan R. Olsen, Lev N. Zakharov, May Nyman, Kristin A. Persson, Kurt G. Ronse, Paolo A. Gargini, Patrick P. Naulleau, and Toshiro Itani."Alkyltin Keggin clusters as EUVL photoresist technology."International Conference on Extreme Ultraviolet Lithography 2019International Conference on Extreme Ultraviolet Lithography 2019 (2019). DOI

2018

2017

2016

2011

1999